求助，Simulation of Single Particle Displacement Damage in Silicon – Par...

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题名	Simulation of Single Particle Displacement Damage in Silicon – Part I: Global Approach and Primary Interaction Simulation
作者	Mélanie Raine ;  Antoine Jay ;  Nicolas Richard ;  Vincent Goiffon ;  Sylvain Girard ;  Marc Gaillardin ;
杂志	IEEE Transactions on Nuclear Science
年|卷|期	Volume: 64, Issue: 1, Jan. 2017
页码	133-140
链接	http://ieeexplore.ieee.org/abstract/document/7582531/

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