| 题名 | Short-Circuit Destruction of Field-Stop-Structure Inslated Gate Bipolar Transistor | | 作者 | Yoshikawa, Koh; Koga, Takeharu; Fujii, Takeshi; Nishiura, Akira; Matsuda, Akinori; Matsumoto, Takashi | | 链接 | https://iopscience.iop.org/article/10.1143/JJAP.43.5973 |
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