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收听数0性别保密听众数27最后登录2023-12-18QQUID8147阅读权限20帖子1541精华0在线时间395 小时注册时间2014-2-17
 
 
 科研币5 速递币5217 娱乐币947 文献值0 资源值0 贡献值0 
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5速递币 
| | 题名 | Redox Reactions at Cu,Ag/Ta2O5 Interfaces and the Effects of Ta2O5 Film Density on the Forming Process in Atomic Switch Structures |  | 链接 | http://onlinelibrary.wiley.com/doi/10.1002/adfm.201500853/abstract | 
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