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标题: Understanding the Switching Oxide Defect Formation and Recovery on HfOx Based... [打印本页]

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作者: tookey0116    时间: 2017-1-5 09:10
标题: Understanding the Switching Oxide Defect Formation and Recovery on HfOx Based...

题名	Understanding the Switching Oxide Defect Formation and Recovery on HfOx Based RRAM Device
链接	http://jss.ecsdl.org/content/5/10/N90

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作者: なつめたかし    时间: 2017-1-5 09:10
链接: http://pan.baidu.com/s/1c1Cv9a4 密码: t2a2

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