| 题名 | Phase Growth in Amorphous Si-Cu and Si-Co Systems: Combination of SNMS, XPS, XRD, and APT Techniques |
| 作者 | B. Parditka et al. |
| 杂志 | Defect and Diffusion Forum |
| 年|卷|期 | Volume 353, May 2014 |
| 页码 | 269-274 |
| 链接 | http://www.scientific.net.sci-hub.org/DDF.353.269 |
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