题名 | Phase Growth in Amorphous Si-Cu and Si-Co Systems: Combination of SNMS, XPS, XRD, and APT Techniques |
作者 | B. Parditka et al. |
杂志 | Defect and Diffusion Forum |
年|卷|期 | Volume 353, May 2014 |
页码 | 269-274 |
链接 | http://www.scientific.net.sci-hub.org/DDF.353.269 |
欢迎光临 科研速递论坛 (http://www.expaper.cn/) | Powered by Discuz! X2.5 |