| 题名 | SVD-based quality metric for image and video using machine learning |
| 作者 | Narwaria, M. ; Sch. of Comput. Eng., Nanyang Technol. Univ., Singapore, Singapore ; Weisi Lin |
| 链接 | http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=6031933&url=http%3A%2F%2Fieeexplore.ieee.org%2Fiel5%2F3477%2F4359268%2F06031933.pdf%3Farnumber%3D6031933 |
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