题名 | Quantifying image distortions using SVD |
作者 | Chong-Yaw Wee ; Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore ; Jiang, X. ; Kot, A.C. ; Paramesran, R. |
链接 | http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=5516904&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D5516904 |
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