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标题: Ion‐induced topography, depth resolution, and ion yield [打印本页]

作者: Anthea14 时间: 2014-4-29 21:43
标题: Ion‐induced topography, depth resolution, and ion yield

题名	Ion‐induced topography, depth resolution, and ion yield during secondary ion mass spectrometry depth profiling of a GaAs/AlGaAs superlattice: Effects of sample rotation
作者	Eun‐Hee Cirlin, John J. Vajo, Robert E. Doty and T. C. Hasenberg
杂志	J. Vac. Sci. Technol. A
年\|卷\|期	(1991) 9
页码	1395
链接	http://scitation.aip.org/content/avs/journal/jvsta/9/3/10.1116/1.577634

作者: cuiwq456 时间: 2014-4-29 21:43
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