| 题名 | High Resolution In Situ TEM Studies of Silicide-Mediated Crystallization of Amorphous Silicon |
| 作者 | C. Hayzelden and J. L. Batstone |
| 杂志 | MRS Proceedings |
| 年|卷|期 | 321(2011) |
| 链接 | http://journals.cambridge.org/action/displayAbstract?fromPage=online&aid=8091120 |
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