| 题名 | Implicit similarity: a new approach to multi-sensor image registration |
| 作者 | Keller, Y. ; Dept. of Comput. Sci., Technion Inst. of Technol., Haifa, Israel ; Averbuch, A. |
| 链接 | http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=1211514&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D1211514 |
| 欢迎光临 科研速递论坛 (http://www.expaper.cn/) | Powered by Discuz! X2.5 |