题名 | A new method for the determination of the diffusion-induced concentration profile and the interdiffusion coefficient for thin film systems by Auger electron spectroscopical sputter depth profiling |
作者 | J.Y. Wang and E.J. Mittemeijer |
杂志 | Journal of Materials Research |
年|卷|期 | Volume 19 / Issue 11 / 2004 |
页码 | pp 3389-3397 |
链接 | http://journals.cambridge.org/action/displayAbstract?fromPage=online&aid=8029800 |
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