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标题: An X-Ray Diffraction Method to Determine Stress [打印本页]

作者: Anthea14 时间: 2014-1-3 12:32
标题: An X-Ray Diffraction Method to Determine Stress

题名	An X-Ray Diffraction Method to Determine Stress at Constant Penetration/Information Depth
作者	W. Reimers and S. Quander
杂志	Materials Science Forum
年\|卷\|期	Volumes 524 - 525
页码	13-18
链接	http://www.scientific.net/MSF.524-525.13

作者: gyrowheel 时间: 2014-1-3 12:32
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作者: gyrowheel 时间: 2014-1-3 12:33
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