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标题: Characterization of sharp interfaces and delta doped layers in semiconductors [打印本页]

作者: Anthea14 时间: 2013-11-28 23:21
标题: Characterization of sharp interfaces and delta doped layers in semiconductors

题名	Characterization of sharp interfaces and delta doped layers in semiconductors using secondary ion mass spectrometry
作者	M.G. Dowsett, R.D. Barlow
杂志	Analytica Chimica Acta
年\|卷\|期	Volume 297, Issues 1–2, 31 October 1994
页码	Pages 253–275
链接	http://www.sciencedirect.com/science/article/pii/0003267093E0568R

作者: gyrowheel 时间: 2013-11-28 23:21
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作者: gyrowheel 时间: 2013-11-28 23:22
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