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标题: The impact of low-holding-voltage issue in high-voltage CMOS technology and t... [打印本页]

作者: skycloud    时间: 2019-5-9 14:16
标题: The impact of low-holding-voltage issue in high-voltage CMOS technology and t...
题名The impact of low-holding-voltage issue in high-voltage CMOS technology and the design of latchup-free power-rail ESD clamp circuit for LCD driver ICs
链接https://ieeexplore.ieee.org/document/1487620


作者: wwjjdd    时间: 2019-5-9 14:16
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