| 题名 | Three-Dimensional Safe Operating Area based Short-Circuit Failure Modes Investigation and Classification for High-Power IGBT Modules |
| 作者 | Yuxiang Chen, Wuhua Li , Member, IEEE, Francesco Iannuzzo, Senior Member, IEEE, Haoze Luo , Xiangning He, Fellow, IEEE, and Frede Blaabjerg, Fellow, IEEE |
| 链接 | http://ieeexplore.ieee.org/abstract/document/7878673/ |
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