| 题名 | The influence of field- and diffusion-current components on the charge-carrier plasma dynamics during turn-off process of p+-n--n+ diodes |
| 作者 | R. Baburske 1 ; B. Heinze 1 ; J. Lutz 1 ; F.-J. Niedernostheide 1 |
| 链接 | http://digital-library.theiet.org/content/conferences/10.1049/ic_20080198 |
感谢
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