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标题: Microscopic origin of read current noise in TaOx-based resistive switching me... [打印本页]

作者: tookey0116 时间: 2016-5-23 08:26
标题: Microscopic origin of read current noise in TaOx-based resistive switching me...

题名	Microscopic origin of read current noise in TaOx-based resistive switching memory by ultra-low temperature measurement
链接	http://scitation.aip.org/content/aip/journal/apl/108/15/10.1063/1.4945790

本帖最后由 tookey0116 于 2016-5-23 08:30 编辑

作者: woxinfeixiang 时间: 2016-5-23 08:26
http://disk.680.com/eeA7z2

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