| 题名 | Resistance switching and memory effects in solution-processed BiFeO3/LaNiO3 junctions |
| 链接 | http://iopscience.iop.org/article/10.1088/0022-3727/49/5/055301 |
本帖最后由 lo7ve77 于 2016-5-19 09:12 编辑
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